Publication Details
Issue: Vol 2, No 6 (2025)
Pages: 86-90
ISSN: 2997-9382
Abstract
This article discusses the types of defects in semiconductor crystals, the causes of their formation, as well as modern methods for reducing these defects. In addition, an analysis of the effectiveness of the results of these methods in real industrial and scientific practice is presented.
Keywords
semiconductors
microchips
diodes